Zerion Pulse™ Series: Five-Year Breakthrough Overcoming GaN Industrialization Barriers_Product News_GALEX

Zerion Pulse™ Series: Five-Year Breakthrough Overcoming GaN Industrialization Barriers
2025.07.29

Core Technical Challenges

GaN Drive Reliability

High-Frequency EMI Suppression

Thermal Density Management


Specification

Value

Engineering Impact

Power Density

13.3 W/cm³

≥60% volume reduction vs. silicon-based solutions

Carrier Frequency

≥60 kHz

Output current ripple reduced to 1/5 of silicon solutions

Input Voltage Range

≤540 VDC

Tolerates industrial grid fluctuations (±15%)

Protection Mechanisms

Over-temp/Over-voltage/Under-voltage/Over-current

Full fault response time<2 μs

Key Technical Advantages

Space Efficiency Revolution
13.3 W/cm³ power density enables compact designs for space-constrained applications.

 

Precision Control Capability
60 kHz carrier frequency achieves ±0.25% speed fluctuation control, ensuring stable operation of sensitive loads.

 

Industrial Environment Robustness
540 VDC wide voltage input complies with EN 61000-4-11, withstanding 40% voltage sags within 10 ms.


Multi-Fault Protection
Quadruple protection circuits adopt hardware-direct-drive architecture; ≤1.5 μs overcurrent shutdown prevents power device avalanche failure.Zerion Pulse™ Series: Five-Year Breakthrough Overcoming GaN Industrialization Barriers(图1)


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